AFSEM Webinar (March 15, 2017)

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Introducing The Leading Solution For Correlative AFM-SEM-EDX Analysis

(a recording of the Nanosurf and GETec webinar of March 15, 2017, 10:00/18:00 CET)

The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

This recorded webinar by Nanosurf and explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.

Topics covered include:
– Introduction and overview of the AFSEM™ system
– Compatibility to existing SEMs and additional add-ons (e.g. tensile stages or nanoindenters)
– Recent application advances (e.g. in-situ roughness and conductivity analysis, correlative SEM/EDX/AFM, 3D tomography)

Experts answer application and instrumentation questions by viewers towards the end of the video.

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tomas

LEAN LEADERSHIP CONSULTANT at TOP WEBINARS EVENT
Online enterprenuer.
Lean leadership consultant.

tomas

Online enterprenuer. Lean leadership consultant.

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