Introducing The Leading Solution For Correlative AFM-SEM-EDX Analysis
(a recording of the Nanosurf and GETec webinar of March 15, 2017, 10:00/18:00 CET)
The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.
This recorded webinar by Nanosurf and explores the recent advances in correlative AFM-SEM-EDX analysis and shows how to combine these techniques in an interactive experiment.
Topics covered include:
– Introduction and overview of the AFSEM™ system
– Compatibility to existing SEMs and additional add-ons (e.g. tensile stages or nanoindenters)
– Recent application advances (e.g. in-situ roughness and conductivity analysis, correlative SEM/EDX/AFM, 3D tomography)
Experts answer application and instrumentation questions by viewers towards the end of the video.